H. Rusty Harris

Texas A&M University

Associate Professor

Department of Electrical and Computer Engineering

Department of Materials Science and Engineering

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Research Area

#Optoelectronics#Materials science#Electronic engineering#Dielectric#Nitride#Physics#Computer science#Algorithm#Oxide#Doping

SCIE paper information

Papers relevant to ‘Optoelectronics’: 3

Research performance of SCIE papers matching with ‘Optoelectronics’

Citations of SCIE papers SCIE papers 06k12k18k24k30k050100150200250300350400

*Papers published between 2014 and 2020 were selected, and the citation number was determined by bing.com.

  • RF Dielectric Loss Due to MOCVD Aluminum Nitride on High Resistivity Silicon

    2017/02 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 3.176 Impact Factor 11 citations

    Feyza Berber, Derek W. Johnson, Kyle M. Sundqvist, Edwin L. Piner, Gregory H. Huff, H. Rusty Harris

    DOI : 10.1109/TMTT.2017.2656865

  • Characterization of ALD Beryllium Oxide as a Potential High-k Gate Dielectric for Low-Leakage AlGaN/GaN MOSHEMTs

    2014/01 JOURNAL OF ELECTRONIC MATERIALS 1.798 Impact Factor 10 citations

    Derek W. Johnson, Jung Hwan Yum, Todd W. Hudnall, Ryan M. Mushinski, Christopher W. Bielawski, John C. Roberts, Wei E. Wang, Sanjay K. Banerjee, H. Rusty Harris

    DOI : 10.1007/S11664-013-2754-1

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Papers for author ‘H. Rusty Harris’: 4

Number of published SCIE papers by year

01234201420172018
H-index 4
Number of NCS papers 0

*Papers published between 2014 and 2020 were selected, and the citation number was determined by bing.com.

  • RF Dielectric Loss Due to MOCVD Aluminum Nitride on High Resistivity Silicon

    2017/02 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 3.176 Impact Factor 11 citations

    Feyza Berber, Derek W. Johnson, Kyle M. Sundqvist, Edwin L. Piner, Gregory H. Huff, H. Rusty Harris

    DOI : 10.1109/TMTT.2017.2656865

  • Characterization of ALD Beryllium Oxide as a Potential High-k Gate Dielectric for Low-Leakage AlGaN/GaN MOSHEMTs

    2014/01 JOURNAL OF ELECTRONIC MATERIALS 1.798 Impact Factor 10 citations

    Derek W. Johnson, Jung Hwan Yum, Todd W. Hudnall, Ryan M. Mushinski, Christopher W. Bielawski, John C. Roberts, Wei E. Wang, Sanjay K. Banerjee, H. Rusty Harris

    DOI : 10.1007/S11664-013-2754-1

How can I correct errors in PhD.GO?