Heeyoung Kim

Heeyoung Kim

Korea Advanced Institute of Science and Technology

Associate Professor

Department of Industrial and Systems Engineering

Research Area

  • #Computer science
  • #Artificial intelligence
  • #Mathematics
  • #Pattern recognition
  • #Materials science
  • #Mathematical optimization
  • #Dirichlet process
  • #Engineering
  • #Data mining
  • #Multivariate statistics

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Related papers to
‘ Computer science ‘ : 18

  • Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks

    2018/05

    1.1 Impact Factor

    72 citations

    Kiryong Kyeong, Heeyoung Kim

    DOI : 10.1109/TSM.2018.2841416

    • #Computer science
    • #Artificial intelligence
    • #Pattern recognition
    • #Wafer
    • #Feature extraction
    • #Binary number
    • #Convolutional neural network
    • #Convolution
    • #Bin
    • #Semiconductor device fabrication
    • #Wafer testing

All papers authored by
‘ Heeyoung Kim ’ : 38

  • A new metric of absolute percentage error for intermittent demand forecasts

    2016/07
    INTERNATIONAL JOURNAL OF FORECASTING

    2.6 Impact Factor

    372 citations

    Sungil Kim, Heeyoung Kim

    DOI : 10.1016/J.IJFORECAST.2015.12.003

    • #Mathematics
    • #Statistics
    • #Bounded function
    • #Outlier
    • #Interpretability
    • #Forecast error
    • #Inverse trigonometric functions
    • #Division by zero
    • #Mean absolute percentage error
    • #Symmetric mean absolute percentage error

Related papers to
‘ Computer science ‘ : 18

  • Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks

    2018/05
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

    1.1 Impact Factor

    72 citations

    Kiryong Kyeong, Heeyoung Kim

    DOI : 10.1109/TSM.2018.2841416

    • #Computer science
    • #Artificial intelligence
    • #Pattern recognition
    • #Wafer
    • #Feature extraction
    • #Binary number
    • #Convolutional neural network
    • #Convolution
    • #Bin
    • #Semiconductor device fabrication
    • #Wafer testing
  • Detection of PVC by using a wavelet-based statistical ECG monitoring procedure

    2017/07
    BIOMEDICAL SIGNAL PROCESSING AND CONTROL

    2.8 Impact Factor

    20 citations

    Yonghan Jung, Heeyoung Kim

    DOI : 10.1016/J.BSPC.2017.03.023

    • #Computer science
    • #Artificial intelligence
    • #Statistics
    • #Pattern recognition
    • #Wavelet
    • #Linear discriminant analysis
    • #Statistical process control
    • #Timely diagnosis
    • #Ecg monitoring
    • #Wavelet transform
    • #Control limits
    • #Discrete wavelet transform

Get access to
Contact information

Log in

All papers authored by
‘ Heeyoung Kim ’ : 38

  • A new metric of absolute percentage error for intermittent demand forecasts

    2016/07
    INTERNATIONAL JOURNAL OF FORECASTING

    2.6 Impact Factor

    372 citations

    Sungil Kim, Heeyoung Kim

    DOI : 10.1016/J.IJFORECAST.2015.12.003

    • #Mathematics
    • #Statistics
    • #Bounded function
    • #Outlier
    • #Interpretability
    • #Forecast error
    • #Inverse trigonometric functions
    • #Division by zero
    • #Mean absolute percentage error
    • #Symmetric mean absolute percentage error
  • Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks

    2018/05
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

    1.1 Impact Factor

    72 citations

    Kiryong Kyeong, Heeyoung Kim

    DOI : 10.1109/TSM.2018.2841416

    • #Computer science
    • #Artificial intelligence
    • #Pattern recognition
    • #Wafer
    • #Feature extraction
    • #Binary number
    • #Convolutional neural network
    • #Convolution
    • #Bin
    • #Semiconductor device fabrication
    • #Wafer testing

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