Hong Il Yoon

Hong Il Yoon

Yonsei University

Associate Professor

School of Electrical and Electronic Engineering

Research Area

  • #Electronic engineering
  • #Voltage
  • #Degradation (geology)
  • #Electrical engineering
  • #Magnetic ram
  • #Mathematics
  • #Monte Carlo method
  • #Spin-transfer torque
  • #Standard deviation
  • #Threshold voltage

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Related papers to
‘ Electronic engineering ‘ : 2

  • Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

    2014/03

    1.9 Impact Factor

    4 citations

    Sanguhn Cha, Hongil Yoon

    DOI : 10.1109/TDMR.2014.2299595

    • #Computer science
    • #Electronic engineering
    • #Error detection and correction
    • #Test data
    • #Bit field
    • #Bit error rate
    • #Parity bit
    • #Memory architecture
    • #Bit manipulation
    • #Non-return-to-zero

All papers authored by
‘ Hong Il Yoon ’ : 2

  • Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

    2014/03
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

    1.9 Impact Factor

    4 citations

    Sanguhn Cha, Hongil Yoon

    DOI : 10.1109/TDMR.2014.2299595

    • #Computer science
    • #Electronic engineering
    • #Error detection and correction
    • #Test data
    • #Bit field
    • #Bit error rate
    • #Parity bit
    • #Memory architecture
    • #Bit manipulation
    • #Non-return-to-zero

Related papers to
‘ Electronic engineering ‘ : 2

  • Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

    2014/03
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

    1.9 Impact Factor

    4 citations

    Sanguhn Cha, Hongil Yoon

    DOI : 10.1109/TDMR.2014.2299595

    • #Computer science
    • #Electronic engineering
    • #Error detection and correction
    • #Test data
    • #Bit field
    • #Bit error rate
    • #Parity bit
    • #Memory architecture
    • #Bit manipulation
    • #Non-return-to-zero
  • Variation-Tolerant Sensing Circuit for Ultralow-Voltage Operation of Spin-Torque Transfer Magnetic RAM

    2017/05
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS

    2.5 Impact Factor

    3 citations

    Kangwook Jo, Hongil Yoon

    DOI : 10.1109/TCSII.2016.2581038

    • #Mathematics
    • #Electrical engineering
    • #Electronic engineering
    • #Voltage
    • #Monte Carlo method
    • #Degradation (geology)
    • #Standard deviation
    • #Transistor
    • #Threshold voltage
    • #Spin-transfer torque
    • #Magnetic ram

Get access to
Contact information

Log in

All papers authored by
‘ Hong Il Yoon ’ : 2

  • Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

    2014/03
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

    1.9 Impact Factor

    4 citations

    Sanguhn Cha, Hongil Yoon

    DOI : 10.1109/TDMR.2014.2299595

    • #Computer science
    • #Electronic engineering
    • #Error detection and correction
    • #Test data
    • #Bit field
    • #Bit error rate
    • #Parity bit
    • #Memory architecture
    • #Bit manipulation
    • #Non-return-to-zero
  • Variation-Tolerant Sensing Circuit for Ultralow-Voltage Operation of Spin-Torque Transfer Magnetic RAM

    2017/05
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS

    2.5 Impact Factor

    3 citations

    Kangwook Jo, Hongil Yoon

    DOI : 10.1109/TCSII.2016.2581038

    • #Mathematics
    • #Electrical engineering
    • #Electronic engineering
    • #Voltage
    • #Monte Carlo method
    • #Degradation (geology)
    • #Standard deviation
    • #Transistor
    • #Threshold voltage
    • #Spin-transfer torque
    • #Magnetic ram

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