Young-Woon Kim

Young-Woon Kim

Seoul National University

Professor

Department of Materials Science and Engineering

Research Area

  • #Materials science
  • #Transmission electron microscopy
  • #Composite material
  • #In situ
  • #Nanotechnology
  • #Metallurgy
  • #Optoelectronics
  • #Analytical chemistry
  • #Graphene
  • #Grain boundary

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Contact information

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Related papers to
‘ Materials science ‘ : 34

  • Graphene as an atomically thin barrier to Cu diffusion into Si.

    2014/06

    7.4 Impact Factor

    86 citations

    Juree Hong, Sanggeun Lee, Seulah Lee, Heetak Han, Chandreswar Mahata, Han Wool Yeon, Bonwoong Koo, Seong Il Kim, Taewook Nam, Kisik Byun, Byung Wook Min, Young Woon Kim, Hyungjun Kim, Young Chang Joo, Taeyoon Lee

    DOI : 10.1039/C3NR06771H

    • #Materials science
    • #Composite material
    • #Nanotechnology
    • #Annealing (metallurgy)
    • #Graphene
    • #Transmission electron microscopy
    • #Grain size
    • #Grain boundary
    • #Dielectric strength
    • #Diffusion barrier
    • #Time-dependent gate oxide breakdown

All papers authored by
‘ Young-Woon Kim ’ : 35

  • Graphene as an atomically thin barrier to Cu diffusion into Si.

    2014/06
    NANOSCALE

    7.4 Impact Factor

    86 citations

    Juree Hong, Sanggeun Lee, Seulah Lee, Heetak Han, Chandreswar Mahata, Han Wool Yeon, Bonwoong Koo, Seong Il Kim, Taewook Nam, Kisik Byun, Byung Wook Min, Young Woon Kim, Hyungjun Kim, Young Chang Joo, Taeyoon Lee

    DOI : 10.1039/C3NR06771H

    • #Materials science
    • #Composite material
    • #Nanotechnology
    • #Annealing (metallurgy)
    • #Graphene
    • #Transmission electron microscopy
    • #Grain size
    • #Grain boundary
    • #Dielectric strength
    • #Diffusion barrier
    • #Time-dependent gate oxide breakdown

Related papers to
‘ Materials science ‘ : 34

  • Graphene as an atomically thin barrier to Cu diffusion into Si.

    2014/06
    NANOSCALE

    7.4 Impact Factor

    86 citations

    Juree Hong, Sanggeun Lee, Seulah Lee, Heetak Han, Chandreswar Mahata, Han Wool Yeon, Bonwoong Koo, Seong Il Kim, Taewook Nam, Kisik Byun, Byung Wook Min, Young Woon Kim, Hyungjun Kim, Young Chang Joo, Taeyoon Lee

    DOI : 10.1039/C3NR06771H

    • #Materials science
    • #Composite material
    • #Nanotechnology
    • #Annealing (metallurgy)
    • #Graphene
    • #Transmission electron microscopy
    • #Grain size
    • #Grain boundary
    • #Dielectric strength
    • #Diffusion barrier
    • #Time-dependent gate oxide breakdown
  • Vertically ordered hematite nanotube array as an ultrasensitive and rapid response acetone sensor.

    2014/08
    ACS APPLIED MATERIALS & INTERFACES

    6.7 Impact Factor

    76 citations

    Do Hong Kim, Young Seok Shim, Jong Myeong Jeon, Hu Young Jeong, Sung Soo Park, Young Woon Kim, Jin Sang Kim, Jong Heun Lee, Ho Won Jang

    DOI : 10.1021/AM504156W

    • #Materials science
    • #Nanotechnology
    • #Metal
    • #Detection limit
    • #Acetone
    • #Response time
    • #Hematite
    • #Parts-per notation
    • #Rapid response
    • #Nanotube array

Get access to
Contact information

Log in

All papers authored by
‘ Young-Woon Kim ’ : 35

  • Graphene as an atomically thin barrier to Cu diffusion into Si.

    2014/06
    NANOSCALE

    7.4 Impact Factor

    86 citations

    Juree Hong, Sanggeun Lee, Seulah Lee, Heetak Han, Chandreswar Mahata, Han Wool Yeon, Bonwoong Koo, Seong Il Kim, Taewook Nam, Kisik Byun, Byung Wook Min, Young Woon Kim, Hyungjun Kim, Young Chang Joo, Taeyoon Lee

    DOI : 10.1039/C3NR06771H

    • #Materials science
    • #Composite material
    • #Nanotechnology
    • #Annealing (metallurgy)
    • #Graphene
    • #Transmission electron microscopy
    • #Grain size
    • #Grain boundary
    • #Dielectric strength
    • #Diffusion barrier
    • #Time-dependent gate oxide breakdown
  • Vertically ordered hematite nanotube array as an ultrasensitive and rapid response acetone sensor.

    2014/08
    ACS APPLIED MATERIALS & INTERFACES

    6.7 Impact Factor

    76 citations

    Do Hong Kim, Young Seok Shim, Jong Myeong Jeon, Hu Young Jeong, Sung Soo Park, Young Woon Kim, Jin Sang Kim, Jong Heun Lee, Ho Won Jang

    DOI : 10.1021/AM504156W

    • #Materials science
    • #Nanotechnology
    • #Metal
    • #Detection limit
    • #Acetone
    • #Response time
    • #Hematite
    • #Parts-per notation
    • #Rapid response
    • #Nanotube array

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