James W. Swan

Massachusetts Institute of Technology

Professor

Department of Chemical Engineering

Center for Computational Science and Engineering

Program in Polymers and Soft Matter

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Research Area

#Materials science#Chemical physics#Physics#Particle#Mechanics#Colloid#Brownian dynamics#Nanotechnology#Viscoelasticity#Rheology

SCIE paper information

Papers relevant to ‘Materials science’: 30

Research performance of SCIE papers matching with ‘Materials science’

Citations of SCIE papers SCIE papers 020k40k60k80k100k02004006008001k1.2k1.4k1.6k

*Papers published between 2014 and 2020 were selected, and the citation number was determined by bing.com.

  • Lipid Exchange Envelope Penetration (LEEP) of Nanoparticles for Plant Engineering: A Universal Localization Mechanism

    2016/01 NANO LETTERS 12.712 Impact Factor 99 citations

    Min Hao Wong, Rahul Prasanna Misra, Juan P. Giraldo, Seon-Yeong Kwak, Young-Woo Son, Markita Patricia Landry, James W. Swan, Daniel Blankschtein, Michael S. Strano

    DOI : 10.1021/ACS.NANOLETT.5B04467

  • Dynamic, Directed Self-Assembly of Nanoparticles via Toggled Interactions

    2016/04 ACS NANO 13.942 Impact Factor 27 citations

    Zachary M. Sherman, James W. Swan

    DOI : 10.1021/ACSNANO.6B01050

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Papers for author ‘James W. Swan’: 53

Number of published SCIE papers by year

04812162014201520162017201820192020
H-index 15
Number of NCS papers 2

*Papers published between 2014 and 2020 were selected, and the citation number was determined by bing.com.

  • Lipid Exchange Envelope Penetration (LEEP) of Nanoparticles for Plant Engineering: A Universal Localization Mechanism

    2016/01 NANO LETTERS 12.712 Impact Factor 99 citations

    Min Hao Wong, Rahul Prasanna Misra, Juan P. Giraldo, Seon-Yeong Kwak, Young-Woo Son, Markita Patricia Landry, James W. Swan, Daniel Blankschtein, Michael S. Strano

    DOI : 10.1021/ACS.NANOLETT.5B04467

  • Directed colloidal self-assembly in toggled magnetic fields

    2014/01 SOFT MATTER 4.029 Impact Factor 84 citations

    James W. Swan, Jonathan L. Bauer, Yifei Liu, Eric M. Furst

    DOI : 10.1039/C3SM52663A

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